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X-ray Diffraction Equipment Product List and Ranking from 5 Manufacturers, Suppliers and Companies

Last Updated： Aggregation Period:Sep 17, 2025～Oct 14, 2025
This ranking is based on the number of page views on our site.

X-ray Diffraction Equipment Manufacturer, Suppliers and Company Rankings

Last Updated： Aggregation Period:Sep 17, 2025～Oct 14, 2025
This ranking is based on the number of page views on our site.

  1. 一般財団法人材料科学技術振興財団　MST Tokyo//Testing, Analysis and Measurement
  2. サーモフィッシャーサイエンティフィック株式会社／Thermo Fisher Scientific K.K. Tokyo//Testing, Analysis and Measurement
  3. スペクトリス株式会社 マルバーン・パナリティカル事業部 Hyogo//Testing, Analysis and Measurement
  4. null/null
  5. 5 東芝ナノアナリシス Kanagawa//Testing, Analysis and Measurement
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X-ray Diffraction Equipment Product ranking

Last Updated： Aggregation Period:Sep 17, 2025～Oct 14, 2025
This ranking is based on the number of page views on our site.

  1. ARL EQUINOX 100 X-ray diffractometer (XRD) サーモフィッシャーサイエンティフィック株式会社／Thermo Fisher Scientific K.K.
  2. Multipurpose X-ray diffraction device Empyrean スペクトリス株式会社 マルバーン・パナリティカル事業部
  3. X-ray diffraction method 一般財団法人材料科学技術振興財団　MST
  4. Fully Automatic Multi-Purpose X-ray Diffraction System: XRDynamic 500
  5. 5 Quantitative analysis of X-ray diffraction data using Rietveld refinement. 東芝ナノアナリシス

X-ray Diffraction Equipment Product List

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ARL EQUINOX 100 X-ray diffractometer (XRD)

ARL EQUINOX 100 X-ray diffractometer (XRD)

An X-ray diffraction device (XRD) equipped with a unique CPS detector that can simultaneously acquire the full diffraction pattern in real time.

The tabletop ARL EQUINOX 100 X-ray diffractometer is a compact tabletop model that enables rapid analysis, in situ experiments, and analysis of crystal phase formation and transitions in materials research and development, dynamic behavior analysis, routine analysis for QA/QC in the pharmaceutical industry, and educational institutions such as universities. The ARL EQUINOX 100 is equipped with a unique CPSCPS (Curved Position Sensitive) detector, allowing for the simultaneous measurement of the entire diffraction pattern (up to 110°/2θ) in a short time. It also supports thin film measurements (GIXRD, XRR) and offers a variety of attachments depending on the measurement requirements.

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Multipurpose X-ray diffraction device Empyrean

Multipurpose X-ray diffraction device Empyrean

From development to quality control! A super high-performance X-ray diffractometer that enables various forms of sample analysis.

The newly developed MultiCore Optics, equipped in the multipurpose X-ray diffraction device Empyrean, enables easy measurement of diverse samples with simple operations. With just one device, it features multipurpose XRD capabilities that capture various highlights of materials from powders to thin films, nanomaterials to solids, at different angles! Applications can be handled in various ways, from a simple configuration that adds a few slits and analysis software to the standard setup, to a top-performance configuration using dedicated optics, light sources, and detectors. 【Features】 ■ Evaluation of products with different raw materials and formulations ■ Strong support for urgent analysis of unknown samples or development products ■ Suitable for efficient measurement of diverse samples ■ Easy operation ■ Over 30% improvement in sample throughput ■ Over 40% higher sensitivity and speed for impurity detection ■ Reduction of errors and omissions in setting multiple measurement conditions ■ 30% reduction in user training time *For more details, please refer to our website.

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X-ray diffraction method

X-ray diffraction method

XRD is a method for obtaining information about the crystal structure of a sample from its diffraction pattern.

- Identification of crystalline substances is possible - Evaluation of crystal size (from a few nm to 100 nm) is possible - Evaluation of crystallinity is possible - Evaluation of orientation is possible - Evaluation of strain and stress is possible - Non-destructive analysis is possible Features of the equipment - Heating analysis is possible from room temperature to 1100°C - Micro-area measurement with a beam diameter of up to 100 μm is possible - Atmosphere control is possible with N2, He, Ar, and vacuum

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[Analysis Case] IGZO

[Analysis Case] IGZO

Case studies of XRD and XRR analysis of oxide semiconductors.

The transparent oxide semiconductor IGZO thin film is being researched and developed as a TFT material for displays. IGZO is a material whose properties change significantly based on the composition of the film, the presence of oxygen vacancies, and crystallinity, making it important to consider the correlation with film quality. We will introduce a case where the crystallinity, film thickness, and film density of three types of IGZO thin films with different heating temperatures were measured and compared using XRD and XRR. It was confirmed non-destructively that crystallization progresses at high temperatures, resulting in higher film density.

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[Analysis Case] Identification of Pyrolysis Products by High-Temperature XRD

[Analysis Case] Identification of Pyrolysis Products by High-Temperature XRD

XRD measurement can be performed while increasing the temperature.

When materials undergo chemical reactions and phase changes with increasing temperature, performing XRD measurements while heating is effective. We present a case where high-temperature XRD measurements were used to identify the decomposition products of copper(II) sulfate pentahydrate. The results showed that the diffraction peaks changed at the temperature where decomposition occurred, clearly confirming the changes in the crystal structure. In MST, it is possible to conduct Out-of-plane XRD measurements and In-plane XRD measurements while heating.

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[Analysis Case] Evaluation of Metal Films by High-Temperature XRD

[Analysis Case] Evaluation of Metal Films by High-Temperature XRD

Tracking evaluation of phase transitions and crystallinity changes during the heating process.

For the sample where Pt was sputter-deposited on a Si substrate, Out-of-plane XRD and In-plane XRD measurements were conducted while increasing the temperature. In both measurements, it was observed that the peak intensity of Pt(111) increased and the full width at half maximum decreased at temperatures above 500°C, indicating that crystallization was progressing. Additionally, it was confirmed that as the temperature rose, thermal expansion caused the peaks to shift towards lower angles (the direction of increased lattice spacing).

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Evaluation of crystallinity of ultra-thin films by high-temperature XRD.

Evaluation of crystallinity of ultra-thin films by high-temperature XRD.

An effective means to understand phase changes, chemical reactions, and changes in lattice constants due to temperature conditions!

We would like to introduce our "Evaluation of Crystallinity of Ultra-Thin Films using High-Temperature XRD." High-temperature X-ray diffraction (XRD) is an effective method for understanding phase changes, chemical reactions, and changes in lattice constants of various materials under different temperature conditions. In the attached PDF document, we present a case study evaluating the changes in the crystal structure of nm-order ultra-thin films using In-Plane XRD and high-temperature measurements, so please take a look. 【Features of High-Temperature + In-Plane XRD】 ■ A method that involves incident X-rays at very low angles and scans the detector in the in-plane direction ■ The incident X-rays do not penetrate deeply from the surface and can only detect diffraction planes that are perpendicular to the surface ■ Information about crystals can be obtained even for ultra-thin films of a few nm *For more details, please download the PDF or feel free to contact us.

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Quantitative analysis of X-ray diffraction data using Rietveld refinement.

Quantitative analysis of X-ray diffraction data using Rietveld refinement.

For applications such as evaluating the particle size and strain of positive/negative electrode materials in the charge and discharge process of secondary batteries!

We would like to introduce our "Quantitative Analysis of X-ray Diffraction Data Using Rietveld Analysis." By applying Rietveld analysis to X-ray diffraction data, it is possible to quantify the mass fraction of crystalline phases, crystallite size, and uniform strain in the sample without the need for standard samples. Please feel free to contact us if you have any inquiries. 【Features】 ■ Quantification of the mass fraction of crystalline phases, crystallite size, and uniform strain in the sample without the need for standard samples. *For more details, please download the PDF or feel free to contact us.

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Thin Film X-ray Diffraction (XRD)

Thin Film X-ray Diffraction (XRD)

It is possible to evaluate the crystallinity of thin films using In-Plane XRD and measure the physical properties of thin films using XRR!

We would like to introduce our "Thin Film X-ray Diffraction (XRD)." In addition to identifying the crystal structure of thin films at the nanometer level, we can also analyze the film density, thickness, and roughness of multilayer films through X-ray reflectivity measurements. By incidenting X-rays with good parallelism at a very shallow angle to the sample, we can achieve an extremely shallow penetration depth of the X-rays, allowing for the evaluation of thin film crystallinity using In-Plane XRD and the measurement of thin film physical properties using XRR. 【Features】 ■ In-Plane XRD (In-Plane Rotation Measurement) Evaluation of crystalline thin films at the nanometer level ■ XRR (X-ray Reflectivity Measurement) Evaluation of film density, thickness, and (surface/interface) roughness ■ Support for general thin film methods (fixed θ 2θ scanning) *For more details, please download the PDF or feel free to contact us.

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Tabletop X-ray diffractometer (XRD) Aeris

Tabletop X-ray diffractometer (XRD) Aeris

【2021 Introduction of Transmission Measurement and Thin Film Measurement Options】 Desktop X-ray Diffraction Device (XRD)! A high-sensitivity analysis instrument capable of detecting crystal phases at concentrations below 1%.

Spectris plc's Malvern Panalytical division has launched a significantly upgraded model of the benchtop powder X-ray diffractometer, Aeris. With the expanded capabilities for thin film XRD (GIXRD) measurements, it is now possible to measure the crystallinity and residual stress of thin films and coating materials. Additionally, the enhancement of the transmittance measurement function reduces the influence of orientation during sample preparation, allowing for more accurate data even from samples like formulation materials. This renewal has enabled the incorporation of functions that were previously only available on large floor-standing systems. The new Aeris is a versatile benchtop X-ray diffractometer that can efficiently provide high-quality data from polycrystalline materials and is designed for use in all environments. Moreover, the user-friendly operability, the safe design that alleviates concerns about X-ray exposure, and the same analysis software capable of detailed analysis as the large floor-standing systems, which were well-regarded in the previous Aeris, have been thoroughly carried over in this renewal. For detailed product descriptions, measurement case studies, or requests for quotes, please feel free to contact us!

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[Analysis Case] Measurement of Residual Stress in Metal Materials Before and After Load Application Using XRD

[Analysis Case] Measurement of Residual Stress in Metal Materials Before and After Load Application Using XRD

It is possible to quantitatively measure tensile and compressive stress non-destructively.

Residual stress measurement is one of the important methods to investigate whether a component can withstand various stress conditions. In XRD (X-ray diffraction), it is possible to determine residual stress by measuring the lattice spacing. This document introduces a case where a sample of aluminum plates with V-shaped processing on both sides was created for tensile testing, and a comparison of residual stress before and after applying tensile load using a tensile testing device, as well as the distribution of residual stress in the sample after application, was confirmed. The residual stress values were determined using the sin²ψ method. For more details, please download the document or contact us.

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[Analysis Case] Degradation Assessment of Cathode Active Material in Secondary Batteries

[Analysis Case] Degradation Assessment of Cathode Active Material in Secondary Batteries

Evaluate the degradation state of active materials from the crystal structure.

The positive electrode active material of lithium-ion secondary batteries, LiCoO2, undergoes changes in crystal interlayer spacing and other characteristics due to lithium intercalation during charge and discharge. It is also known that overcharging and long-term cycling tests can significantly alter the composition and crystal structure, leading to a decline in charge and discharge characteristics. In this presentation, we will introduce cases where these changes were evaluated using XRD and Raman spectroscopy. Furthermore, by conducting in situ (operando) XRD measurements, it is also possible to evaluate the crystal structure at various states of charge (SOC). Measurement methods: XRD, Raman, SEM Product field: Secondary batteries Analysis purposes: Composition evaluation and identification, composition distribution evaluation, shape evaluation, structural evaluation, product investigation For more details, please download the materials or contact us.

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[Analysis Case] Evaluation of Hierarchical Structure of Polymer Materials Using X-ray Diffraction and Scattering Techniques

[Analysis Case] Evaluation of Hierarchical Structure of Polymer Materials Using X-ray Diffraction and Scattering Techniques

Structural analysis of lamellae and similar structures is possible! Similar evaluations can be performed using WAXS (Wide-Angle X-ray Scattering).

Our organization conducts evaluations of the hierarchical structure of polymer materials using X-ray diffraction and scattering techniques. It is known that the differences in higher-order structures created by amphiphilic substances affect the moisturizing and permeability properties of skin tissue, making it important to understand these structures in order to evaluate the functionality of the materials. We will introduce examples of evaluating the hierarchical structure of polymers using XRD (X-ray diffraction) for structures on the order of a few nanometers and SAXS (small-angle X-ray scattering) for structures on the order of several tens of nanometers. 【Measurement and Processing Methods】 ■ [XRD] X-ray Diffraction ■ [SAXS] Small-Angle X-ray Scattering *For more details, please download the PDF or feel free to contact us.

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X-ray diffraction test

X-ray diffraction test

Ideal for quantitative analysis of environmental dust! X-ray diffraction equipment capable of measurements at high temperatures!

The "X-ray diffraction apparatus" is a device used to investigate the crystal structure, or the name of the material, by measuring the angles and intensities of the diffracted X-rays. From the diffraction positions and integrated intensities during qualitative analysis, quantitative analysis for each material can also be performed using the Rietveld refinement method. Additionally, measurements can be conducted at high temperatures (typically from room temperature to 1300 °C). 【Test Items】 ■ Identification of crystal structure and quantitative analysis ■ Measurement of lattice size and lattice strain ■ Quantitative analysis of environmental dust *For more details, please refer to the catalog or feel free to contact us.

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